Abstract
The mechanism of growth of silicate films at the air/liquid interface has been investigated in situ by a series of grazing incidence diffraction experiments using a 20 × 25 cm2 imaging plate as the detector. C18TAX (X = Br- or Cl-) has been used as the film templating surfactant. The formation of a layered phase, prior to growth of the hexagonal mesophase in C18TABr templated films, has been seen. This layered structure has a significantly shorter d spacing compared to the final hexagonal film (43 versus 48 Å, respectively). The correlation lengths associated with the development of the hexagonal in-plane diffraction spots are much longer in-plane than perpendicular to the air/liquid interface (300 Å versus 50 Å). This implies that the film forms via the growth or aggregation of islands that are initially only a micelle or two thick, which then grow down into the solution.
Original language | English |
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Pages (from-to) | 2330-2336 |
Number of pages | 7 |
Journal | Journal of Physical Chemistry B |
Volume | 106 |
Issue number | 9 |
DOIs | |
Publication status | Published - 7 Mar 2002 |