Study of defects in ion-implanted silicon using photoluminescence and positron annihilation

R. Harding*, G. Davies, P. G. Coleman, C. P. Burrows, J. Wong-Leung

*Corresponding author for this work

    Research output: Contribution to journal › Conference article › peer-review

    5 Citations (Scopus)

    Fingerprint

    Dive into the research topics of 'Study of defects in ion-implanted silicon using photoluminescence and positron annihilation'. Together they form a unique fingerprint.

    Material Science