Surface characterisation of a ferroelectric single crystal by Kelvin probe force microscopy

Taim Soon (Kenny) Lau, Yun Liu, Qian Li, Zhenrong Li, Ray Withers, Zhuo Xu

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	190-194
Journal	Journal of Surface Engineered Materials and Advanced Technology
Volume	3
Issue number	3
DOIs	https://doi.org/10.4236/jsemat.2013.33026
Publication status	Published - 2013

Access to Document

@article{1859a65ba422444aba662e625e15d5ae,

title = "Surface characterisation of a ferroelectric single crystal by Kelvin probe force microscopy",

author = "Lau, {Taim Soon (Kenny)} and Yun Liu and Qian Li and Zhenrong Li and Ray Withers and Zhuo Xu",

year = "2013",

doi = "10.4236/jsemat.2013.33026",

language = "English",

volume = "3",

pages = "190--194",

journal = "Journal of Surface Engineered Materials and Advanced Technology",

publisher = "Scientific Research Publishing, Inc.",

number = "3",

}

TY - JOUR

T1 - Surface characterisation of a ferroelectric single crystal by Kelvin probe force microscopy

AU - Lau, Taim Soon (Kenny)

AU - Liu, Yun

AU - Li, Qian

AU - Li, Zhenrong

AU - Withers, Ray

AU - Xu, Zhuo

PY - 2013

Y1 - 2013

U2 - 10.4236/jsemat.2013.33026

DO - 10.4236/jsemat.2013.33026

M3 - Article

VL - 3

SP - 190

EP - 194

JO - Journal of Surface Engineered Materials and Advanced Technology

JF - Journal of Surface Engineered Materials and Advanced Technology

IS - 3

ER -