TY - GEN
T1 - Surface modification of silicon nano mechanical structures by carbon ion implantation for post-fabrication transformation to silicon carbide
AU - Virwani, Kumar R.
AU - Sood, Dinesh K.
AU - Elliman, Robert G.
AU - Malshe, Ajay P.
PY - 2005
Y1 - 2005
N2 - Internal stresses can cause de-lamination and fracture of coatings and structures and it is well known that ion-implantation can be used to control such behavior through modification of the stress. Here, however, we show that the unique ability of implantation to create controlled stresses in materials by altering both the chemical composition and mechanical properties, combined with an increase in the bending strength of materials, can used to create novel vertical nanostructures. Silicon cantilevers (beams), 193nm thick, 200nm wide and 3μm long, were implanted with carbon ions to create a buried SiC x layers. The internal stresses generated by implantation caused the beams to bend at angles ranging from 10 degrees to greater than 90 degrees, leading to unique vertical nanostructures. This method can be used to create 3-D nano electromechanical systems (NEMS).
AB - Internal stresses can cause de-lamination and fracture of coatings and structures and it is well known that ion-implantation can be used to control such behavior through modification of the stress. Here, however, we show that the unique ability of implantation to create controlled stresses in materials by altering both the chemical composition and mechanical properties, combined with an increase in the bending strength of materials, can used to create novel vertical nanostructures. Silicon cantilevers (beams), 193nm thick, 200nm wide and 3μm long, were implanted with carbon ions to create a buried SiC x layers. The internal stresses generated by implantation caused the beams to bend at angles ranging from 10 degrees to greater than 90 degrees, leading to unique vertical nanostructures. This method can be used to create 3-D nano electromechanical systems (NEMS).
UR - http://www.scopus.com/inward/record.url?scp=34249937116&partnerID=8YFLogxK
U2 - 10.1557/proc-0908-oo16-03
DO - 10.1557/proc-0908-oo16-03
M3 - Conference contribution
SN - 1558998632
SN - 9781558998636
T3 - Materials Research Society Symposium Proceedings
SP - 205
EP - 210
BT - Growth, Modification and Analysis by Ion Beams at the Nanoscale
PB - Materials Research Society
T2 - 2005 MRS Fall Meeting
Y2 - 28 November 2005 through 2 December 2005
ER -