Surface modification of silicon nano mechanical structures by carbon ion implantation for post-fabrication transformation to silicon carbide

Kumar R. Virwani*, Dinesh K. Sood, Robert G. Elliman, Ajay P. Malshe

*Corresponding author for this work

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    Abstract

    Internal stresses can cause de-lamination and fracture of coatings and structures and it is well known that ion-implantation can be used to control such behavior through modification of the stress. Here, however, we show that the unique ability of implantation to create controlled stresses in materials by altering both the chemical composition and mechanical properties, combined with an increase in the bending strength of materials, can used to create novel vertical nanostructures. Silicon cantilevers (beams), 193nm thick, 200nm wide and 3μm long, were implanted with carbon ions to create a buried SiC x layers. The internal stresses generated by implantation caused the beams to bend at angles ranging from 10 degrees to greater than 90 degrees, leading to unique vertical nanostructures. This method can be used to create 3-D nano electromechanical systems (NEMS).

    Original languageEnglish
    Title of host publicationGrowth, Modification and Analysis by Ion Beams at the Nanoscale
    PublisherMaterials Research Society
    Pages205-210
    Number of pages6
    ISBN (Print)1558998632, 9781558998636
    DOIs
    Publication statusPublished - 2005
    Event2005 MRS Fall Meeting - Boston, MA, United States
    Duration: 28 Nov 20052 Dec 2005

    Publication series

    NameMaterials Research Society Symposium Proceedings
    Volume908
    ISSN (Print)0272-9172

    Conference

    Conference2005 MRS Fall Meeting
    Country/TerritoryUnited States
    CityBoston, MA
    Period28/11/052/12/05

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