Surface near-edge x-ray adsorption fine structure of hydrogenated diamond films and Di(100) surfaces studied by H+ and H- ion desorption

A. Hoffman; G. Comtet; L. Hellner; G. Dujardin; M. Petravic

doi:10.1063/1.122113

Surface near-edge x-ray adsorption fine structure of hydrogenated diamond films and Di(100) surfaces studied by H⁺ and H^- ion desorption

A. Hoffman^*, G. Comtet, L. Hellner, G. Dujardin, M. Petravic

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

43 Citations (Scopus)

Abstract

The near-edge x-ray absorption fine structures (NEXAFS) of hydrogenated diamond films and single-crystal diamond surfaces have been studied by recording the partial electron yield and the H⁺ and H^- ion desorption yields as a function of photon energies around the C(1s) core level. It has been found that ion desorption is much more surface sensitive than electron emission, especially for the C(1s)-σ^*(C-H) surface resonance which is enhanced in the H⁺ ion yield. This enhanced surface sensitivity of ion desorption has enabled us to compare in detail the surface NEXAFS structure of both hydrogenated surfaces and to ascertain the quality of the diamond film.

Original language	English
Pages (from-to)	1152-1154
Number of pages	3
Journal	Applied Physics Letters
Volume	73
Issue number	8
DOIs	https://doi.org/10.1063/1.122113
Publication status	Published - 1998

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abstract = "The near-edge x-ray absorption fine structures (NEXAFS) of hydrogenated diamond films and single-crystal diamond surfaces have been studied by recording the partial electron yield and the H+ and H- ion desorption yields as a function of photon energies around the C(1s) core level. It has been found that ion desorption is much more surface sensitive than electron emission, especially for the C(1s)-σ*(C-H) surface resonance which is enhanced in the H+ ion yield. This enhanced surface sensitivity of ion desorption has enabled us to compare in detail the surface NEXAFS structure of both hydrogenated surfaces and to ascertain the quality of the diamond film.",

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AU - Hoffman, A.

AU - Comtet, G.

AU - Hellner, L.

AU - Dujardin, G.

AU - Petravic, M.

PY - 1998

Y1 - 1998

N2 - The near-edge x-ray absorption fine structures (NEXAFS) of hydrogenated diamond films and single-crystal diamond surfaces have been studied by recording the partial electron yield and the H+ and H- ion desorption yields as a function of photon energies around the C(1s) core level. It has been found that ion desorption is much more surface sensitive than electron emission, especially for the C(1s)-σ*(C-H) surface resonance which is enhanced in the H+ ion yield. This enhanced surface sensitivity of ion desorption has enabled us to compare in detail the surface NEXAFS structure of both hydrogenated surfaces and to ascertain the quality of the diamond film.

AB - The near-edge x-ray absorption fine structures (NEXAFS) of hydrogenated diamond films and single-crystal diamond surfaces have been studied by recording the partial electron yield and the H+ and H- ion desorption yields as a function of photon energies around the C(1s) core level. It has been found that ion desorption is much more surface sensitive than electron emission, especially for the C(1s)-σ*(C-H) surface resonance which is enhanced in the H+ ion yield. This enhanced surface sensitivity of ion desorption has enabled us to compare in detail the surface NEXAFS structure of both hydrogenated surfaces and to ascertain the quality of the diamond film.

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DO - 10.1063/1.122113

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SN - 0003-6951

VL - 73

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EP - 1154

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 8

ER -

Surface near-edge x-ray adsorption fine structure of hydrogenated diamond films and Di(100) surfaces studied by H⁺ and H^- ion desorption

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