Switching spectroscopic measurement of surface potentials on ferroelectric surfaces via an open-loop Kelvin probe force microscopy method

Qian Li; Yun Liu; Danyang Wang; Ray L. Withers; Zhenrong Li; Haosu Luo; Zhuo Xu

doi:10.1063/1.4772511

Switching spectroscopic measurement of surface potentials on ferroelectric surfaces via an open-loop Kelvin probe force microscopy method

Qian Li, Yun Liu^*, Danyang Wang, Ray L. Withers, Zhenrong Li, Haosu Luo, Zhuo Xu

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

13 Citations (Scopus)

Abstract

We report a method for switching spectroscopy Kelvin probe force microscopy (SS-KPFM). The method is established as a counterpart to switching spectroscopy piezoresponse force microscopy (SS-PFM) in Kelvin probe force microscopy. SS-KPFM yields quantitative information about the surface charge state during a local bias-induced polarization switching process, complementary to the electromechanical coupling properties probed via SS-PFM. Typical ferroelectric samples of a Pb-based relaxor single crystal and a BiFeO₃ thin film were investigated using both methods. We briefly discuss the observed surface charging phenomena and their influence on the associated piezoresponse hysteresis loops.

Original language	English
Article number	242906
Journal	Applied Physics Letters
Volume	101
Issue number	24
DOIs	https://doi.org/10.1063/1.4772511
Publication status	Published - 10 Dec 2012

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@article{44c3e62d1b1546259fe8bfabd7771f6f,

title = "Switching spectroscopic measurement of surface potentials on ferroelectric surfaces via an open-loop Kelvin probe force microscopy method",

abstract = "We report a method for switching spectroscopy Kelvin probe force microscopy (SS-KPFM). The method is established as a counterpart to switching spectroscopy piezoresponse force microscopy (SS-PFM) in Kelvin probe force microscopy. SS-KPFM yields quantitative information about the surface charge state during a local bias-induced polarization switching process, complementary to the electromechanical coupling properties probed via SS-PFM. Typical ferroelectric samples of a Pb-based relaxor single crystal and a BiFeO3 thin film were investigated using both methods. We briefly discuss the observed surface charging phenomena and their influence on the associated piezoresponse hysteresis loops.",

author = "Qian Li and Yun Liu and Danyang Wang and Withers, {Ray L.} and Zhenrong Li and Haosu Luo and Zhuo Xu",

year = "2012",

month = dec,

day = "10",

doi = "10.1063/1.4772511",

language = "English",

volume = "101",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "24",

}

TY - JOUR

T1 - Switching spectroscopic measurement of surface potentials on ferroelectric surfaces via an open-loop Kelvin probe force microscopy method

AU - Li, Qian

AU - Liu, Yun

AU - Wang, Danyang

AU - Withers, Ray L.

AU - Li, Zhenrong

AU - Luo, Haosu

AU - Xu, Zhuo

PY - 2012/12/10

Y1 - 2012/12/10

N2 - We report a method for switching spectroscopy Kelvin probe force microscopy (SS-KPFM). The method is established as a counterpart to switching spectroscopy piezoresponse force microscopy (SS-PFM) in Kelvin probe force microscopy. SS-KPFM yields quantitative information about the surface charge state during a local bias-induced polarization switching process, complementary to the electromechanical coupling properties probed via SS-PFM. Typical ferroelectric samples of a Pb-based relaxor single crystal and a BiFeO3 thin film were investigated using both methods. We briefly discuss the observed surface charging phenomena and their influence on the associated piezoresponse hysteresis loops.

AB - We report a method for switching spectroscopy Kelvin probe force microscopy (SS-KPFM). The method is established as a counterpart to switching spectroscopy piezoresponse force microscopy (SS-PFM) in Kelvin probe force microscopy. SS-KPFM yields quantitative information about the surface charge state during a local bias-induced polarization switching process, complementary to the electromechanical coupling properties probed via SS-PFM. Typical ferroelectric samples of a Pb-based relaxor single crystal and a BiFeO3 thin film were investigated using both methods. We briefly discuss the observed surface charging phenomena and their influence on the associated piezoresponse hysteresis loops.

UR - http://www.scopus.com/inward/record.url?scp=84871270669&partnerID=8YFLogxK

U2 - 10.1063/1.4772511

DO - 10.1063/1.4772511

M3 - Article

SN - 0003-6951

VL - 101

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 24

M1 - 242906

ER -

Switching spectroscopic measurement of surface potentials on ferroelectric surfaces via an open-loop Kelvin probe force microscopy method

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