t-Fault t/2-Step Sequentially Diagnosable Systems

Kewal K. Saluja; Brian D.O. Anderson

doi:10.1109/PROC.1979.11562

t-Fault t/2-Step Sequentially Diagnosable Systems

Kewal K. Saluja, Brian D.O. Anderson

Research output: Contribution to journal › Article › peer-review

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Abstract

Fault diagnosis is considered for systems comprising n units u 0,u 1,…, u n-1 in which u i tests u i+1 and u i+2. A necessary and sufficient condition for the diagnosability of t faults in t/2 or t/2 + 1/2 steps is stated, the condition talcing the form of an inequality relating n and t.

Original language	English
Pages (from-to)	1678-1679
Number of pages	2
Journal	Proceedings of the IEEE
Volume	67
Issue number	12
DOIs	https://doi.org/10.1109/PROC.1979.11562
Publication status	Published - Dec 1979
Externally published	Yes

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10.1109/PROC.1979.11562

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title = "t-Fault t/2-Step Sequentially Diagnosable Systems",

abstract = "Fault diagnosis is considered for systems comprising n units u 0,u 1,…, u n-1 in which u i tests u i+1 and u i+2. A necessary and sufficient condition for the diagnosability of t faults in t/2 or t/2 + 1/2 steps is stated, the condition talcing the form of an inequality relating n and t.",

author = "Saluja, \{Kewal K.\} and Anderson, \{Brian D.O.\}",

year = "1979",

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AU - Saluja, Kewal K.

AU - Anderson, Brian D.O.

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N2 - Fault diagnosis is considered for systems comprising n units u 0,u 1,…, u n-1 in which u i tests u i+1 and u i+2. A necessary and sufficient condition for the diagnosability of t faults in t/2 or t/2 + 1/2 steps is stated, the condition talcing the form of an inequality relating n and t.

AB - Fault diagnosis is considered for systems comprising n units u 0,u 1,…, u n-1 in which u i tests u i+1 and u i+2. A necessary and sufficient condition for the diagnosability of t faults in t/2 or t/2 + 1/2 steps is stated, the condition talcing the form of an inequality relating n and t.

UR - https://www.scopus.com/pages/publications/0018681756

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DO - 10.1109/PROC.1979.11562

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JO - Proceedings of the IEEE

JF - Proceedings of the IEEE

IS - 12

ER -

t-Fault t/2-Step Sequentially Diagnosable Systems

Abstract

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