Temperature-dependent EXAFS analysis of embedded Pt nanocrystals

R. Giulian*, L. L. Araujo, P. Kluth, D. J. Sprouster, C. S. Schnohr, G. J. Foran, M. C. Ridgway

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    20 Citations (Scopus)

    Abstract

    The vibrational and thermal properties of embedded Pt nanocrystals (NCs) have been investigated with temperature-dependent extended x-ray absorption fine structure (EXAFS) spectroscopy. NCs of diameter 1.8-7.4nm produced by ion implantation in amorphous SiO2 were analysed over the temperature range 20-295K. An increase in Einstein temperature (∼194K) relative to that of a Pt standard (∼179K) was evident for the smallest NCs while those larger than ∼2.0nm exhibited values comparable to bulk material. Similarly, the thermal expansion of interatomic distances was lowest for small NCs. While the amorphous SiO2 matrix restricted the thermal expansion of interatomic distances, it did not have a significant influence on the mean vibrational frequency of embedded Pt NCs. Instead, the latter was governed by finite-size effects or, specifically, capillary pressure.

    Original languageEnglish
    Article number155302
    JournalJournal of Physics Condensed Matter
    Volume21
    Issue number15
    DOIs
    Publication statusPublished - 2009

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