Temperature-dependent EXAFS measurements of InP

C. S. Schnohr, P. Kluth, L. L. Araujo, D. J. Sprouster, G. J. Foran, M. C. Ridgway

    Research output: Contribution to journalConference articlepeer-review

    Abstract

    The extended X-ray absorption fine structure (EXAFS) of crystalline InP was measured in the temperature range of 20-295 K. Structural parameters were determined for the first, second and third nearest neighbor (NN) shells. The Debye-Waller factors increase as functions of both radial distance and temperature. The first NN Debye-Waller factor increases slowly with temperature whereas those for the second and third NN shell increase significantly. The influence of correlated motion on the vibrational behavior of the different shells is readily evidenced. Fitting an Einstein model to the first NN Debye-Waller factor yields an Einstein temperature ΘE = 394 ± 8 K, compared to a value of ΘE = 360 ± 24 K for GaAs. Debye temperatures reported for InP vary between 220 and 440 K depending on the temperature and method of determination.

    Original languageEnglish
    Pages (from-to)132-134
    Number of pages3
    JournalAIP Conference Proceedings
    Volume1092
    DOIs
    Publication statusPublished - 2009
    Event6th International Conference on Synchrotron Radiation in Materials Science - Campinas, Sao Paulo, Brazil
    Duration: 20 Jul 200823 Jul 2008

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