TY - CHAP
T1 - The Correlation Between Raman Spectra and the Mineral Composition of Muscovite and Phengite
AU - Li, Huijuan
AU - Zhang, Lifei
AU - Christy, Andrew G.
PY - 2011
Y1 - 2011
N2 - On the basis of a comprehensive investigation of the Raman spectra of 94 natural muscovite and phengite samples, with Si content ranging from 3.0 to 3.55 p.f.u., the conclusions that can be drawn are, two different types of Raman spectra for muscovite and phengite samples were obtained in this study. Type II spectra are characterized by the vibrational tensor components parallel to the mica (001) plane. Type I spectra are characterized by vibrational tensor components parallel to the c axis, type I spectra, with Si < 3.15, have a high-intensity tetrahedral peak at 1050 cm-1. Type I spectra, with Si > 3.15, have a high-intensity tetrahedral peak at 1115 cm-1. This feature enables us to distinguish muscovite and phengite samples by simply locating the high-intensity tetrahedral peak in type I Raman spectra, with increasing Si content, peak splitting, peak disappearance, and variation in peak intensity were observed in the Raman spectra, and peak shifting with increasing Si content was quantified by linear regression. Application of the linear equations derived for peaks at 3620, 3650, 266, 370, 420, 703, 790, and 1115 cm-1 make Raman spectroscopy a useful, semiquantitative method for estimating the Si content of muscovite/phengite samples.
AB - On the basis of a comprehensive investigation of the Raman spectra of 94 natural muscovite and phengite samples, with Si content ranging from 3.0 to 3.55 p.f.u., the conclusions that can be drawn are, two different types of Raman spectra for muscovite and phengite samples were obtained in this study. Type II spectra are characterized by the vibrational tensor components parallel to the mica (001) plane. Type I spectra are characterized by vibrational tensor components parallel to the c axis, type I spectra, with Si < 3.15, have a high-intensity tetrahedral peak at 1050 cm-1. Type I spectra, with Si > 3.15, have a high-intensity tetrahedral peak at 1115 cm-1. This feature enables us to distinguish muscovite and phengite samples by simply locating the high-intensity tetrahedral peak in type I Raman spectra, with increasing Si content, peak splitting, peak disappearance, and variation in peak intensity were observed in the Raman spectra, and peak shifting with increasing Si content was quantified by linear regression. Application of the linear equations derived for peaks at 3620, 3650, 266, 370, 420, 703, 790, and 1115 cm-1 make Raman spectroscopy a useful, semiquantitative method for estimating the Si content of muscovite/phengite samples.
KW - Muscovite
KW - Peak shift
KW - Phengite
KW - Raman spectra
KW - Si content
UR - http://www.scopus.com/inward/record.url?scp=84882904159&partnerID=8YFLogxK
U2 - 10.1016/B978-0-12-385144-4.00006-0
DO - 10.1016/B978-0-12-385144-4.00006-0
M3 - Chapter
SN - 9780123851444
SP - 187
EP - 212
BT - Ultrahigh-Pressure Metamorphism
PB - Elsevier Inc.
ER -