The design of model predictive control for an AFM and its impact on piezo nonlinearities

Md Sohel Rana; Hemanshu R. Pota; Ian R. Petersen

doi:10.1016/j.ejcon.2014.04.002

The design of model predictive control for an AFM and its impact on piezo nonlinearities

Md Sohel Rana^*, Hemanshu R. Pota, Ian R. Petersen

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

19 Citations (Scopus)

Abstract

An atomic force microscope (AFM) is an extremely versatile investigative tool in the field of nanotechnology, the performance of which is significantly influenced due to the nonlinear behavior of its scanning unit; i.e., the piezoelectric tube scanner (PTS). In order to increase the imaging speed of the AFM, a model predictive control (MPC) scheme is applied in both the X and Y-piezo axes of the PTS to reduce its nonlinearity effects and to improve in damping of the resonant mode. The proposed controller provides an AFM with the capability to achieve improved tracking and it results in the reduction of the hysteresis, creep, vibration, and cross-coupling effects in piezoactuators. The experimental results demonstrate the effectiveness of the proposed control scheme.

Original language	English
Pages (from-to)	188-198
Number of pages	11
Journal	European Journal of Control
Volume	20
Issue number	4
DOIs	https://doi.org/10.1016/j.ejcon.2014.04.002
Publication status	Published - Jul 2014
Externally published	Yes

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10.1016/j.ejcon.2014.04.002

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title = "The design of model predictive control for an AFM and its impact on piezo nonlinearities",

abstract = "An atomic force microscope (AFM) is an extremely versatile investigative tool in the field of nanotechnology, the performance of which is significantly influenced due to the nonlinear behavior of its scanning unit; i.e., the piezoelectric tube scanner (PTS). In order to increase the imaging speed of the AFM, a model predictive control (MPC) scheme is applied in both the X and Y-piezo axes of the PTS to reduce its nonlinearity effects and to improve in damping of the resonant mode. The proposed controller provides an AFM with the capability to achieve improved tracking and it results in the reduction of the hysteresis, creep, vibration, and cross-coupling effects in piezoactuators. The experimental results demonstrate the effectiveness of the proposed control scheme.",

keywords = "Atomic force microscope, Creep, Cross-coupling, Hysteresis, Nanotechnology, Resonant mode",

author = "Rana, {Md Sohel} and Pota, {Hemanshu R.} and Petersen, {Ian R.}",

year = "2014",

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AU - Pota, Hemanshu R.

AU - Petersen, Ian R.

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AB - An atomic force microscope (AFM) is an extremely versatile investigative tool in the field of nanotechnology, the performance of which is significantly influenced due to the nonlinear behavior of its scanning unit; i.e., the piezoelectric tube scanner (PTS). In order to increase the imaging speed of the AFM, a model predictive control (MPC) scheme is applied in both the X and Y-piezo axes of the PTS to reduce its nonlinearity effects and to improve in damping of the resonant mode. The proposed controller provides an AFM with the capability to achieve improved tracking and it results in the reduction of the hysteresis, creep, vibration, and cross-coupling effects in piezoactuators. The experimental results demonstrate the effectiveness of the proposed control scheme.

KW - Atomic force microscope

KW - Creep

KW - Cross-coupling

KW - Hysteresis

KW - Nanotechnology

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SP - 188

EP - 198

JO - European Journal of Control

JF - European Journal of Control

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The design of model predictive control for an AFM and its impact on piezo nonlinearities

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