The effect of Au and O implantation on the etch rate of CVD diamond

Patrick W. Leech*, Geoffrey K. Reeves, Anthony Holland, Mark C. Ridgway

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    3 Citations (Scopus)

    Abstract

    Diamond films were implanted with Au or O ions at multiple energies in order to produce a uniform region of C vacancies. Analysis of the implanted films by Raman spectroscopy has shown that the proportion of non-diamond or amorphous carbon increased with dose (5×10 13 to 5×10 15 ions/cm 2 ). For implantation with Au ions, a complete amorphization near to the surface was evident at a dose of 5×10 15 ions/cm 2 . We have examined the ion beam etch (IBE) rate of the films as a function of the implant species and dose. The etching experiments were performed using either Ar or Ar/O 2 gases at a bias energy of 500-1000eV. In Ar gas, the process of sputter etching has produced a similar increase in etch rate with dose for both the Au and O implants. In Ar/O 2 gases, the process of ion-enhanced chemical etching produced greater etch rates than obtained in Ar gas with higher rates for the Au than the O implants.

    Original languageEnglish
    Pages (from-to)302-307
    Number of pages6
    JournalApplied Surface Science
    Volume221
    Issue number1-4
    DOIs
    Publication statusPublished - 15 Jan 2004

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