The effect of ion-implantation on the resistive switching response of NiO thin films

M.N. Saleh; Dinesh Venkatachalam; Sung-I Kim; Kidane Belay; Rob Elliman

The effect of ion-implantation on the resistive switching response of NiO thin films

M.N. Saleh, Dinesh Venkatachalam, Sung-I Kim, Kidane Belay, Rob Elliman

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Original language	English
Title of host publication	Proceedings of the 16th AINSE Conference on Nuclear and Complementary Techniques of Analysis
Editors	Conference Program Committee
Place of Publication	Sydney Australia
Publisher	Australian Institute of Nuclear Science and Engineering (AINSE)
Pages	4
Edition	Peer Reviewed
ISBN (Print)	9780975843486
Publication status	Published - 2010
Event	AINSE Conference on Nuclear and Complementary Techniques of Analysis (NCTA 2009) - Lucas Heights Australia Duration: 1 Jan 2010 → …

Conference

Conference	AINSE Conference on Nuclear and Complementary Techniques of Analysis (NCTA 2009)
Period	1/01/10 → …
Other	November 25-27 2009

Cite this

Saleh, M.N. ; Venkatachalam, Dinesh ; Kim, Sung-I et al. / The effect of ion-implantation on the resistive switching response of NiO thin films. Proceedings of the 16th AINSE Conference on Nuclear and Complementary Techniques of Analysis. editor / Conference Program Committee. Peer Reviewed. ed. Sydney Australia : Australian Institute of Nuclear Science and Engineering (AINSE), 2010. pp. 4

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title = "The effect of ion-implantation on the resistive switching response of NiO thin films",

author = "M.N. Saleh and Dinesh Venkatachalam and Sung-I Kim and Kidane Belay and Rob Elliman",

year = "2010",

language = "English",

isbn = "9780975843486",

pages = "4",

editor = "{Conference Program Committee}",

booktitle = "Proceedings of the 16th AINSE Conference on Nuclear and Complementary Techniques of Analysis",

publisher = "Australian Institute of Nuclear Science and Engineering (AINSE)",

edition = "Peer Reviewed",

note = "AINSE Conference on Nuclear and Complementary Techniques of Analysis (NCTA 2009) ; Conference date: 01-01-2010",

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Saleh, MN, Venkatachalam, D, Kim, S-I, Belay, K & Elliman, R 2010, The effect of ion-implantation on the resistive switching response of NiO thin films. in CPC (ed.), Proceedings of the 16th AINSE Conference on Nuclear and Complementary Techniques of Analysis. Peer Reviewed edn, Australian Institute of Nuclear Science and Engineering (AINSE), Sydney Australia, pp. 4, AINSE Conference on Nuclear and Complementary Techniques of Analysis (NCTA 2009), 1/01/10.

The effect of ion-implantation on the resistive switching response of NiO thin films. / Saleh, M.N.; Venkatachalam, Dinesh; Kim, Sung-I et al.
Proceedings of the 16th AINSE Conference on Nuclear and Complementary Techniques of Analysis. ed. / Conference Program Committee. Peer Reviewed. ed. Sydney Australia: Australian Institute of Nuclear Science and Engineering (AINSE), 2010. p. 4.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - The effect of ion-implantation on the resistive switching response of NiO thin films

AU - Saleh, M.N.

AU - Venkatachalam, Dinesh

AU - Kim, Sung-I

AU - Belay, Kidane

AU - Elliman, Rob

PY - 2010

Y1 - 2010

M3 - Conference contribution

SN - 9780975843486

SP - 4

BT - Proceedings of the 16th AINSE Conference on Nuclear and Complementary Techniques of Analysis

A2 - null, Conference Program Committee

PB - Australian Institute of Nuclear Science and Engineering (AINSE)

CY - Sydney Australia

T2 - AINSE Conference on Nuclear and Complementary Techniques of Analysis (NCTA 2009)

Y2 - 1 January 2010

ER -