The HIPASS catalogue - II. Completeness, reliability and parameter accuracy

M. A. Zwaan*, M. J. Meyer, R. L. Webster, L. Staveley-Smith, M. J. Drinkwater, D. G. Barnes, R. Bhathal, W. J.G. De Blok, M. J. Disney, R. D. Ekers, K. C. Freeman, D. A. Garcia, B. K. Gibson, J. Harnett, P. A. Henning, M. Howlett, H. Jerjen, M. J. Kesteven, V. A. Kilborn, P. M. KnezekB. S. Koribalski, S. Mader, M. Marquarding, R. F. Minchin, J. O'Brien, T. Oosterloo, M. J. Pierce, R. M. Price, M. E. Putman, E. Ryan-Weber, S. D. Ryder, E. M. Sadler, J. Stevens, I. M. Stewart, F. Stootman, M. Waugh, A. E. Wright

*Corresponding author for this work

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