@inproceedings{b07971499cf749b6981b3df009ff7ef8,
title = "The influence of crystal orientation on surface passivation in multi-crystalline silicon",
abstract = "We present an approach to study the variation of the surface recombination velocity in multi-crystalline silicon wafers through photoluminescence imaging for thin, passivated and mirror polished wafers. The influence of crystal orientation on surface passivation is investigated for various passivating films, including silicon nitride and aluminum oxide. Our results show that the influence of surface orientation is negligible in well passivated multi-crystalline silicon wafers due to the detrimental effects of crystal defects. Our study on hydrogenated samples suggests that aluminum oxide passivation exhibits a similar surface dependence as native oxide passivation. A slight and different surface dependence is observed in one of the silicon nitride films used in the study.",
keywords = "Charge carrier lifetime, Photoluminescence, Silicon, Surfaces",
author = "Sio, {Hang Cheong} and Phang, {Sieu Pheng} and Yimao Wan and Wensheng Liang and Thorsten Trupke and Sheng Cao and Dongli Hu and Yuepeng Wan and Daniel Macdonald",
year = "2013",
doi = "10.1109/PVSC.2013.6744486",
language = "English",
isbn = "9781479932993",
series = "Conference Record of the IEEE Photovoltaic Specialists Conference",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "1770--1775",
booktitle = "39th IEEE Photovoltaic Specialists Conference, PVSC 2013",
address = "United States",
note = "39th IEEE Photovoltaic Specialists Conference, PVSC 2013 ; Conference date: 16-06-2013 Through 21-06-2013",
}