The influence of swift heavy ion irradiation on the recrystallization of amorphous Fe 80B 20

M. D. Rodriguez; B. Afra; C. Trautmann; N. Kirby; P. Kluth

doi:10.1016/j.mee.2012.05.030

The influence of swift heavy ion irradiation on the recrystallization of amorphous Fe ₈₀B ₂₀

M. D. Rodriguez^*, B. Afra, C. Trautmann, N. Kirby, P. Kluth

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

4 Citations (Scopus)

Abstract

Ion tracks in amorphous Fe ₈₀B ₂₀, produced by irradiation with 11.1 MeV/u Au ions, were characterized using synchrotron based small angle X-ray scattering. The tracks resemble long cylindrical structures with a radius of 8.2 ± 0.1 nm. Annealing experiments reveal an activation energy for track recovery E _a = 0.39 ± 0.10 eV. Wide angle X-ray scattering measurements of irradiated and unirradiated amorphous Fe ₈₀B ₂₀ samples indicate enhanced recrystallization for the irradiated material.

Original language	English
Pages (from-to)	64-66
Number of pages	3
Journal	Microelectronic Engineering
Volume	102
DOIs	https://doi.org/10.1016/j.mee.2012.05.030
Publication status	Published - Feb 2013

Access to Document

10.1016/j.mee.2012.05.030

Cite this

@article{11e3ab56ea8b4ad897a6a4a77d62d0d9,

title = "The influence of swift heavy ion irradiation on the recrystallization of amorphous Fe 80B 20 ",

abstract = "Ion tracks in amorphous Fe 80B 20, produced by irradiation with 11.1 MeV/u Au ions, were characterized using synchrotron based small angle X-ray scattering. The tracks resemble long cylindrical structures with a radius of 8.2 ± 0.1 nm. Annealing experiments reveal an activation energy for track recovery E a = 0.39 ± 0.10 eV. Wide angle X-ray scattering measurements of irradiated and unirradiated amorphous Fe 80B 20 samples indicate enhanced recrystallization for the irradiated material.",

keywords = "Amorphous metal, Radiation damage, Recrystallization",

author = "Rodriguez, {M. D.} and B. Afra and C. Trautmann and N. Kirby and P. Kluth",

year = "2013",

month = feb,

doi = "10.1016/j.mee.2012.05.030",

language = "English",

volume = "102",

pages = "64--66",

journal = "Microelectronic Engineering",

issn = "0167-9317",

publisher = "Elsevier B.V.",

}

TY - JOUR

T1 - The influence of swift heavy ion irradiation on the recrystallization of amorphous Fe 80B 20

AU - Rodriguez, M. D.

AU - Afra, B.

AU - Trautmann, C.

AU - Kirby, N.

AU - Kluth, P.

PY - 2013/2

Y1 - 2013/2

N2 - Ion tracks in amorphous Fe 80B 20, produced by irradiation with 11.1 MeV/u Au ions, were characterized using synchrotron based small angle X-ray scattering. The tracks resemble long cylindrical structures with a radius of 8.2 ± 0.1 nm. Annealing experiments reveal an activation energy for track recovery E a = 0.39 ± 0.10 eV. Wide angle X-ray scattering measurements of irradiated and unirradiated amorphous Fe 80B 20 samples indicate enhanced recrystallization for the irradiated material.

AB - Ion tracks in amorphous Fe 80B 20, produced by irradiation with 11.1 MeV/u Au ions, were characterized using synchrotron based small angle X-ray scattering. The tracks resemble long cylindrical structures with a radius of 8.2 ± 0.1 nm. Annealing experiments reveal an activation energy for track recovery E a = 0.39 ± 0.10 eV. Wide angle X-ray scattering measurements of irradiated and unirradiated amorphous Fe 80B 20 samples indicate enhanced recrystallization for the irradiated material.

KW - Amorphous metal

KW - Radiation damage

KW - Recrystallization

UR - http://www.scopus.com/inward/record.url?scp=84869079209&partnerID=8YFLogxK

U2 - 10.1016/j.mee.2012.05.030

DO - 10.1016/j.mee.2012.05.030

M3 - Article

SN - 0167-9317

VL - 102

SP - 64

EP - 66

JO - Microelectronic Engineering

JF - Microelectronic Engineering

ER -

The influence of swift heavy ion irradiation on the recrystallization of amorphous Fe ₈₀B ₂₀

Abstract

Access to Document

Other files and links

Fingerprint

Cite this