The nano-scratch technique as a novel method for measurement of an interphase width

Zbigniew Stachurski, Alma Hodzic, J K Kim

    Research output: Contribution to journalArticlepeer-review

    Original languageEnglish
    Pages (from-to)1665-1667
    JournalJournal of Materials Science Letters
    Volume19
    Publication statusPublished - 2000

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