The role of Fe on the crystallisation of α-Si3N4 from amorphous Si-N formed by ion implantation

Z. L. Li, J. Wong-Leung, P. N.K. Deenapanray, M. Conway, D. J. Chivers, J. D. Fitz Gerald, J. S. Williams*

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    6 Citations (Scopus)

    Abstract

    Ion implantation into Si has been used to produce near-surface, amorphous Si-N layers with the nitrogen content both below and exceeding Si3N4 stoichiometry. Iron has been introduced into some of these layers to study the effect of Fe on subsequent crystallisation to α-Si3N4. Rutherford backscattering and channeling, X-ray diffraction and cross-sectional transmission electron microscopy have been used to analyse these implanted samples before and after annealing to 1000°C. These results provide considerable insight into M-Si3N4 formed by another non-equilibrium mixing process, namely reactive ball milling or mechanochemistry.

    Original languageEnglish
    Pages (from-to)534-539
    Number of pages6
    JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
    Volume148
    Issue number1-4
    DOIs
    Publication statusPublished - 1999

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