THE spectral response of the open-circuit voltage: A new technique for solar cell characterization

Helmut Mäckel*, Andrés Cuevas

*Corresponding author for this work

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    1 Citation (Scopus)

    Abstract

    This paper explores the possibility of measuring the open-circuit voltage as a function of wavelength as a tool for device characterization. Computer simulations show that the spectral response of the open-circuit voltage exhibits a similar dependence to the spectral response of the short-circuit current. Experimental studies on silicon solar cells confirmed the strong spectral dependence of the open-circuit voltage. The spectral measurements have been performed using a quasi-steady state open-circuit voltage method, which also allows to determine the spectral response of the maximum power voltage. The advantages of this new technique over conventional spectral response measurements include its applicability directly after junction formation and its simple apparatus.

    Original languageEnglish
    Title of host publicationProceddings of the 3rd World Conference on Photovoltaic Energy Conversion
    EditorsK. Kurokawa, L.L. Kazmerski, B. McNeils, M. Yamaguchi, C. Wronski
    Pages79-82
    Number of pages4
    Publication statusPublished - 2003
    EventProceddings of the 3rd World Conference on Photovoltaic Energy Conversion - Osaka, Japan
    Duration: 11 May 200318 May 2003

    Publication series

    NameProceedings of the 3rd World Conference on Photovoltaic Energy Conversion
    VolumeA

    Conference

    ConferenceProceddings of the 3rd World Conference on Photovoltaic Energy Conversion
    Country/TerritoryJapan
    CityOsaka
    Period11/05/0318/05/03

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