Abstract
An analysis of the sub-wavelength imaging performance of disordered thin wire media is undertaken, in order to understand how its performance may be affected by manufacturing errors. The structure is found to be extremely robust to disorder which keeps the wires parallel. Variation in the orientation of the wires and their longitudinal position causes more significant degradation in the image quality, which is quantified numerically.
| Original language | English |
|---|---|
| Pages (from-to) | 3919-3921 |
| Number of pages | 3 |
| Journal | Physics Letters, Section A: General, Atomic and Solid State Physics |
| Volume | 372 |
| Issue number | 21 |
| DOIs | |
| Publication status | Published - 19 May 2008 |
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