Abstract
The thermal response of nanoscale cylindrical inclusions of amorphous SiO2 embedded in crystalline quartz c-SiO2 is investigated by means of small-angle x-ray scattering. The inclusions are generated by swift heavy-ion irradiation that leads to the formation of amorphous ion tracks along the ion trajectories. During in situ annealing between room temperature and 620 °C, we observe an irreversible expansion of the track cylinders followed by a reversible contraction. The reversible "elastic" response of the tracks can be modeled using the temperature-dependent elastic properties of bulk amorphous and crystalline SiO2 for the inclusions and the matrix, respectively. A high initial interface pressure of the nanocylinders is apparent from the calculations.
Original language | English |
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Article number | 224108 |
Journal | Physical Review B - Condensed Matter and Materials Physics |
Volume | 90 |
Issue number | 22 |
DOIs | |
Publication status | Published - 30 Dec 2014 |