Third Generation Photovoltaics Multilayers Investigated by X-Ray Reflectivity (poster)

D Bellet; E Bellet-Almaric; T.  Hanley; A. Nelson; D Song; T Fangsuwannarak; S. W. Park; E Pink; G Scardera; E.C. Cho; D König; G Conibeer

Third Generation Photovoltaics Multilayers Investigated by X-Ray Reflectivity (poster)

D Bellet^*, E Bellet-Almaric, T. Hanley, A. Nelson, D Song, T Fangsuwannarak, S. W. Park, E Pink, G Scardera, E.C. Cho, D König, G Conibeer

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

This paper reports on the investigation of multilayered Third Generation Photovoltaics by X-ray Reflectivity. This technique is well suited for the acquisition of thickness, density and roughness information in a non-destructive and statistical way. Fringes related to the inverse total thickness of the multilayer are observed allowing an accurate measurement of the growth rate as well as a possible annealing shrinkage. Some constructive interferences resulting from the periodicity of the multilayer can also be observed. A quantitative analysis is possible through data fitting. Results related to the main systems intended for Third Generation Photovoltaic purposes are presented.

Original language	English
Title of host publication	Proceedings of the Twenty Second European Photovoltaic Solar Energy Conference (22E-PVSEC)
Subtitle of host publication	Proc. on CD-ROM
Editors	G. Willecke, Heinz Ossenbrink, Peter Helm
Pages	472-476
Number of pages	5
ISBN (Electronic)	3-936338-22-1
Publication status	Published - 7 Sept 2007
Externally published	Yes
Event	22nd European Photovoltaic Solar Energy Conference 2007 - Milan, Italy Duration: 3 Sept 2007 → 7 Sept 2007 https://www.eupvsec.org/index.php/conference/authors-workstation?view=article&id=287&catid=31 (Evidence of Peer Review)

Conference

Conference	22nd European Photovoltaic Solar Energy Conference 2007
Abbreviated title	22E-PVSEC
Country/Territory	Italy
City	Milan
Period	3/09/07 → 7/09/07
Internet address	https://www.eupvsec.org/index.php/conference/authors-workstation?view=article&id=287&catid=31 (Evidence of Peer Review)

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https://www.researchgate.net/publication/255662748_Third_generation_photovoltaics_multilayers_investigated_by_X-ray_reflectivity

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Bellet, D., Bellet-Almaric, E., Hanley, T., Nelson, A., Song, D., Fangsuwannarak, T., Park, S. W., Pink, E., Scardera, G., Cho, E. C., König, D., & Conibeer, G. (2007). Third Generation Photovoltaics Multilayers Investigated by X-Ray Reflectivity (poster). In G. Willecke, H. Ossenbrink, & P. Helm (Eds.), Proceedings of the Twenty Second European Photovoltaic Solar Energy Conference (22E-PVSEC): Proc. on CD-ROM (pp. 472-476). Article 1CV.2.23 https://www.researchgate.net/publication/255662748_Third_generation_photovoltaics_multilayers_investigated_by_X-ray_reflectivity

@inproceedings{eb827aaa34ba4e7d8866163d94c57655,

title = "Third Generation Photovoltaics Multilayers Investigated by X-Ray Reflectivity (poster)",

abstract = "This paper reports on the investigation of multilayered Third Generation Photovoltaics by X-ray Reflectivity. This technique is well suited for the acquisition of thickness, density and roughness information in a non-destructive and statistical way. Fringes related to the inverse total thickness of the multilayer are observed allowing an accurate measurement of the growth rate as well as a possible annealing shrinkage. Some constructive interferences resulting from the periodicity of the multilayer can also be observed. A quantitative analysis is possible through data fitting. Results related to the main systems intended for Third Generation Photovoltaic purposes are presented.",

keywords = "Characterization, Interfaces, X-ray Reflectivity",

author = "D Bellet and E Bellet-Almaric and T. Hanley and A. Nelson and D Song and T Fangsuwannarak and Park, {S. W.} and E Pink and G Scardera and E.C. Cho and D K{\"o}nig and G Conibeer",

year = "2007",

month = sep,

day = "7",

language = "English",

pages = "472--476",

editor = "Willecke, {G. } and Ossenbrink, {Heinz } and Peter Helm",

booktitle = "Proceedings of the Twenty Second European Photovoltaic Solar Energy Conference (22E-PVSEC)",

note = "22nd European Photovoltaic Solar Energy Conference 2007, 22E-PVSEC ; Conference date: 03-09-2007 Through 07-09-2007",

url = "https://www.eupvsec.org/index.php/conference/authors-workstation?view=article&id=287&catid=31",

}

Bellet, D, Bellet-Almaric, E, Hanley, T, Nelson, A, Song, D, Fangsuwannarak, T, Park, SW, Pink, E, Scardera, G, Cho, EC, König, D & Conibeer, G 2007, Third Generation Photovoltaics Multilayers Investigated by X-Ray Reflectivity (poster). in G Willecke, H Ossenbrink & P Helm (eds), Proceedings of the Twenty Second European Photovoltaic Solar Energy Conference (22E-PVSEC): Proc. on CD-ROM., 1CV.2.23, pp. 472-476, 22nd European Photovoltaic Solar Energy Conference 2007, Milan, Italy, 3/09/07. <https://www.researchgate.net/publication/255662748_Third_generation_photovoltaics_multilayers_investigated_by_X-ray_reflectivity>

Third Generation Photovoltaics Multilayers Investigated by X-Ray Reflectivity (poster). / Bellet, D; Bellet-Almaric, E; Hanley, T. et al.
Proceedings of the Twenty Second European Photovoltaic Solar Energy Conference (22E-PVSEC): Proc. on CD-ROM. ed. / G. Willecke; Heinz Ossenbrink; Peter Helm. 2007. p. 472-476 1CV.2.23.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Third Generation Photovoltaics Multilayers Investigated by X-Ray Reflectivity (poster)

AU - Bellet, D

AU - Bellet-Almaric, E

AU - Hanley, T.

AU - Nelson, A.

AU - Song, D

AU - Fangsuwannarak, T

AU - Park, S. W.

AU - Pink, E

AU - Scardera, G

AU - Cho, E.C.

AU - König, D

AU - Conibeer, G

PY - 2007/9/7

Y1 - 2007/9/7

N2 - This paper reports on the investigation of multilayered Third Generation Photovoltaics by X-ray Reflectivity. This technique is well suited for the acquisition of thickness, density and roughness information in a non-destructive and statistical way. Fringes related to the inverse total thickness of the multilayer are observed allowing an accurate measurement of the growth rate as well as a possible annealing shrinkage. Some constructive interferences resulting from the periodicity of the multilayer can also be observed. A quantitative analysis is possible through data fitting. Results related to the main systems intended for Third Generation Photovoltaic purposes are presented.

AB - This paper reports on the investigation of multilayered Third Generation Photovoltaics by X-ray Reflectivity. This technique is well suited for the acquisition of thickness, density and roughness information in a non-destructive and statistical way. Fringes related to the inverse total thickness of the multilayer are observed allowing an accurate measurement of the growth rate as well as a possible annealing shrinkage. Some constructive interferences resulting from the periodicity of the multilayer can also be observed. A quantitative analysis is possible through data fitting. Results related to the main systems intended for Third Generation Photovoltaic purposes are presented.

KW - Characterization

KW - Interfaces

KW - X-ray Reflectivity

M3 - Conference contribution

SP - 472

EP - 476

BT - Proceedings of the Twenty Second European Photovoltaic Solar Energy Conference (22E-PVSEC)

A2 - Willecke, G.

A2 - Ossenbrink, Heinz

A2 - Helm, Peter

T2 - 22nd European Photovoltaic Solar Energy Conference 2007

Y2 - 3 September 2007 through 7 September 2007

ER -

Third Generation Photovoltaics Multilayers Investigated by X-Ray Reflectivity (poster)

Abstract

Conference

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