Abstract
A minimal lifetime of microseconds is displayed by the dication GeH2+, which has been detected for the first time as the product of charge-stripping experiments at 8 kV involving [GeH2]+ and O2. Coupled-cluster calculations suggest that XH2+ (X = Si, Ge) are both metastable with respect to internal conversion and dissociation via X+ and H+. The picture shows a potential energy surface scan of GeH2+ and the corresponding Coulomb repulsion asymptote.
Original language | English |
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Pages (from-to) | 1445-1447 |
Number of pages | 3 |
Journal | Angewandte Chemie - International Edition |
Volume | 39 |
Issue number | 8 |
DOIs | |
Publication status | Published - 17 Apr 2000 |