Transfer function sensitivity for discrete and integrated circuits

R. W. Newcomb; B. D.O. Anderson

doi:10.1016/0026-2714(70)90554-8

Transfer function sensitivity for discrete and integrated circuits

R. W. Newcomb^*, B. D.O. Anderson

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

Abstract

Structures consisting of uniform types of resistive and dielectric materials for the realization of tarnsfer functions are investigated. It is shown through the use of dimensional analysis that the transfer function sensitivity depends only upon the transfer function and not upon the realization configuration. An interpretation through the Bode plot shows that sharp cut-off leads to high sensitivity.

Original language	English
Pages (from-to)	341-344
Number of pages	4
Journal	Microelectronics Reliability
Volume	9
Issue number	4
DOIs	https://doi.org/10.1016/0026-2714(70)90554-8
Publication status	Published - Jul 1970
Externally published	Yes

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title = "Transfer function sensitivity for discrete and integrated circuits",

abstract = "Structures consisting of uniform types of resistive and dielectric materials for the realization of tarnsfer functions are investigated. It is shown through the use of dimensional analysis that the transfer function sensitivity depends only upon the transfer function and not upon the realization configuration. An interpretation through the Bode plot shows that sharp cut-off leads to high sensitivity.",

author = "Newcomb, {R. W.} and Anderson, {B. D.O.}",

year = "1970",

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AU - Newcomb, R. W.

AU - Anderson, B. D.O.

PY - 1970/7

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AB - Structures consisting of uniform types of resistive and dielectric materials for the realization of tarnsfer functions are investigated. It is shown through the use of dimensional analysis that the transfer function sensitivity depends only upon the transfer function and not upon the realization configuration. An interpretation through the Bode plot shows that sharp cut-off leads to high sensitivity.

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U2 - 10.1016/0026-2714(70)90554-8

DO - 10.1016/0026-2714(70)90554-8

M3 - Article

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VL - 9

SP - 341

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JO - Microelectronics Reliability

JF - Microelectronics Reliability

IS - 4

ER -

Transfer function sensitivity for discrete and integrated circuits

Abstract

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