Transmission electron microscopy observation of deformation microstructure under spherical indentation in silicon

J. E. Bradby, J. S. Williams, J. Wong-Leung, M. V. Swain, P. Munroe

    Research output: Contribution to journalArticlepeer-review

    204 Citations (Scopus)

    Fingerprint

    Dive into the research topics of 'Transmission electron microscopy observation of deformation microstructure under spherical indentation in silicon'. Together they form a unique fingerprint.

    Material Science