Transmission electron microscopy of ultramicrotome samples of porous InSb formed by ion implantation

D. J. Llewellyn^*, S. M. Kluth, M. C. Ridgway

^*Corresponding author for this work

Research output: Contribution to journal › Review article › peer-review

1 Citation (Scopus)

Original language	English
Pages (from-to)	640-641
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	12
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927606064622
Publication status	Published - Aug 2006

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title = "Transmission electron microscopy of ultramicrotome samples of porous InSb formed by ion implantation",

author = "Llewellyn, \{D. J.\} and Kluth, \{S. M.\} and Ridgway, \{M. C.\}",

year = "2006",

month = aug,

doi = "10.1017/S1431927606064622",

language = "English",

volume = "12",

pages = "640--641",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press ",

number = "SUPPL. 2",

}

TY - JOUR

T1 - Transmission electron microscopy of ultramicrotome samples of porous InSb formed by ion implantation

AU - Llewellyn, D. J.

AU - Kluth, S. M.

AU - Ridgway, M. C.

PY - 2006/8

Y1 - 2006/8

UR - https://www.scopus.com/pages/publications/33750874078

U2 - 10.1017/S1431927606064622

DO - 10.1017/S1431927606064622

M3 - Review article

SN - 1431-9276

VL - 12

SP - 640

EP - 641

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -