Transmission Electron Microscopy Studies of Transition Metal Oxides Employed as Carrier Selective Contacts in Silicon Solar Cells

Haider Ali, James Bullock, Geoffrey Gregory, Xinbo Yang, Matthew Schneider, Klaus Weber, Ali Javey, Kristopher O. Davis

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    3 Citations (Scopus)

    Abstract

    The focus of this work is on the nano-scale characterization of transition metal oxides employed as carrier selective contacts in crystalline silicon (c-Si) solar cells using crosssectional transmission electron microscopy (TEM). Both electronselective (titanium dioxide, TiO 2 ) and hole-selective (molybdenum oxide, MoO x ; tungsten oxide, WO x textbf) contacts were investigated. High-resolution TEM (HRTEM) images were obtained with a FEI Tecnai F30 TEM.

    Original languageEnglish
    Title of host publication2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    Pages2192-2194
    Number of pages3
    ISBN (Electronic)9781538685297
    DOIs
    Publication statusPublished - 26 Nov 2018
    Event7th IEEE World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - Waikoloa Village, United States
    Duration: 10 Jun 201815 Jun 2018

    Publication series

    Name2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC

    Conference

    Conference7th IEEE World Conference on Photovoltaic Energy Conversion, WCPEC 2018
    Country/TerritoryUnited States
    CityWaikoloa Village
    Period10/06/1815/06/18

    Fingerprint

    Dive into the research topics of 'Transmission Electron Microscopy Studies of Transition Metal Oxides Employed as Carrier Selective Contacts in Silicon Solar Cells'. Together they form a unique fingerprint.

    Cite this