Original language | English |
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Pages (from-to) | 1577-1579 |
Journal | Applied Physics Letters |
Volume | 80 |
Issue number | 9 |
Publication status | Published - 2002 |
Trap-Limited Migration of Vacancy-Type Defects in 7.5 keV H--Implanted Si
Prakash Deenapanray
Research output: Contribution to journal › Article › peer-review