Ultra High Impedance Diagnostics of Electrostatic Accelerators with Improved Resolution

Nikolai Lobanov, Peter Linardakis, Dimitrios Tsifakis, Thomas Tunningley

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    Abstract

    This contribution describes a new technique to diagnose faults with high-voltage components in electrostatic accelerators. The main applications of this technique are non-invasive testing of high-voltage grading systems; measuring insulation resistance or determining the volume and surface resistivity of insulation materials used in column posts and acceleration tubes. A simple and practical fault finding data interpretation procedure has been established based on simple concepts. As a result of efficient in-situ troubleshooting and fault elimination techniques, the relative resistance deviation ΔR/R is kept below ±2.5% at the conclusion of maintenance procedures. In 2015 the technique was enhanced by increasing the test voltage from 40 V to 100 V. Experimental verification of the improved resolution was conducted during recent scheduled accelerator maintenance in May-June 2015.
    Original languageEnglish
    Title of host publicationULTRA HIGH IMPEDANCE DIAGNOSTICS OF ELECTROSTATIC ACCELERATORS WITH IMPROVED RESOLUTION
    Place of PublicationJapan
    PublisherEPJ Web of Conferences
    Pages282-284
    Editionpeer reviewed
    ISBN (Print)9783954501311
    DOIs
    Publication statusPublished - 2015
    EventInternational Conference on Heavy Ion Accelerator Technology HIAT 2015 - Yokohama, Japan, Japan
    Duration: 1 Jan 2015 → …
    http://www.rarf.riken.jp/hiat2015/proceedings/html/author.htm

    Conference

    ConferenceInternational Conference on Heavy Ion Accelerator Technology HIAT 2015
    Country/TerritoryJapan
    Period1/01/15 → …
    OtherSeptember 7-11 2015
    Internet address

    Fingerprint

    Dive into the research topics of 'Ultra High Impedance Diagnostics of Electrostatic Accelerators with Improved Resolution'. Together they form a unique fingerprint.

    Cite this