Using interaction-based readouts to approach the ultimate limit of detection noise robustness for quantum-enhanced metrology in collective spin systems

Simon A. Haine, Ruvi Lecamwasam, Joseph Hope

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    Abstract

    We consider the role of detection noise in quantum-enhanced metrology in collective spin systems, and derive a fundamental bound for the maximum obtainable sensitivity for a given level of added detection noise. We then present an interaction-based readout utilising the commonly used one-axis twisting scheme that approaches this bound for states generated via several commonly considered methods of generating quantum enhancement, such as one-axis twisting, two-axis counter-twisting, twist-and-turn squeezing, quantum non-demolition measurements, and adiabatically scanning through a quantum phase transition. We demonstrate that this method performs significantly better than other recently proposed interaction-based readouts. These results may help provide improved sensitivity for quantum sensing devices in the presence of unavoidable detection noise.

    Original languageEnglish
    Title of host publicationOptical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology
    EditorsSelim M. Shahriar, Jacob Scheuer
    PublisherSPIE
    ISBN (Electronic)9781510625105
    DOIs
    Publication statusPublished - 2019
    EventOptical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology 2019 - San Francisco, United States
    Duration: 2 Feb 20197 Feb 2019

    Publication series

    NameProceedings of SPIE - The International Society for Optical Engineering
    Volume10934
    ISSN (Print)0277-786X
    ISSN (Electronic)1996-756X

    Conference

    ConferenceOptical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology 2019
    Country/TerritoryUnited States
    CitySan Francisco
    Period2/02/197/02/19

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