Using X-ray tomography, PALS and Raman spectroscopy for characterization of inhibitors in epoxy coatings

A. E. Hughes*, S. Mayo, Y. S. Yang, T. Markley, S. V. Smith, S. Sellaiyan, A. Uedono, S. G. Hardin, T. H. Muster

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    17 Citations (Scopus)

    Abstract

    Model paint materials were generated by adding a range of inorganic materials into an epoxy. The inorganic materials included inhibitors (Zn 3(PO 4) 2 and SrCrO 4) and a filler (rutile TiO 2).The SrCrO 4 system was characterized using SEM, TEM, PALS and Raman spectroscopy and found to have an even distribution of inhibitor in the polymer matrix. X-ray tomography was performed on the mixed SrCrO 4/TiO 2 and Zn 3(PO 4) 2/TiO 2 systems. A new technique called data constrained modelling was combined with the tomographic technique to produce a 3D distribution of the inorganic phases within the polymer matrix.

    Original languageEnglish
    Pages (from-to)726-733
    Number of pages8
    JournalProgress in Organic Coatings
    Volume74
    Issue number4
    DOIs
    Publication statusPublished - Aug 2012

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