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Using X-ray tomography, PALS and Raman spectroscopy for characterization of inhibitors in epoxy coatings

  • A. E. Hughes*
  • , S. Mayo
  • , Y. S. Yang
  • , T. Markley
  • , S. V. Smith
  • , S. Sellaiyan
  • , A. Uedono
  • , S. G. Hardin
  • , T. H. Muster
  • *Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    21 Citations (Scopus)

    Abstract

    Model paint materials were generated by adding a range of inorganic materials into an epoxy. The inorganic materials included inhibitors (Zn 3(PO 4) 2 and SrCrO 4) and a filler (rutile TiO 2).The SrCrO 4 system was characterized using SEM, TEM, PALS and Raman spectroscopy and found to have an even distribution of inhibitor in the polymer matrix. X-ray tomography was performed on the mixed SrCrO 4/TiO 2 and Zn 3(PO 4) 2/TiO 2 systems. A new technique called data constrained modelling was combined with the tomographic technique to produce a 3D distribution of the inorganic phases within the polymer matrix.

    Original languageEnglish
    Pages (from-to)726-733
    Number of pages8
    JournalProgress in Organic Coatings
    Volume74
    Issue number4
    DOIs
    Publication statusPublished - Aug 2012

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