TY - GEN
T1 - Visualization of the internal structure of orientation-patterned III-V semiconductors
AU - Karpinski, Pawel
AU - Chen, Xin
AU - Shvedov, Vladlen
AU - Hnatovsky, Cyril
AU - Grisard, Arnaud
AU - Lallier, Eric
AU - Luther-Davies, Barry
AU - Krolikowski, Wieslaw
AU - Sheng, Yan
PY - 2015/5/4
Y1 - 2015/5/4
N2 - We investigate nonlinear diffraction in orientation-patterned semiconductors and identify Čerenkov second harmonic generation in a transverse geometry of interaction. Čerenkov second harmonic allows nondestructive 3D visualization of the internal structure of orientationpatterned semiconductor.
AB - We investigate nonlinear diffraction in orientation-patterned semiconductors and identify Čerenkov second harmonic generation in a transverse geometry of interaction. Čerenkov second harmonic allows nondestructive 3D visualization of the internal structure of orientationpatterned semiconductor.
UR - http://www.scopus.com/inward/record.url?scp=84935427809&partnerID=8YFLogxK
U2 - 10.1364/CLEO_SI.2015.STh1H.6
DO - 10.1364/CLEO_SI.2015.STh1H.6
M3 - Conference contribution
T3 - CLEO: Science and Innovations, CLEO-SI 2015
SP - 2267
BT - CLEO
PB - Optica Publishing Group
T2 - CLEO: Science and Innovations, CLEO-SI 2015
Y2 - 10 May 2015 through 15 May 2015
ER -