Visualization of the internal structure of orientation-patterned III-V semiconductors

Pawel Karpinski, Xin Chen, Vladlen Shvedov, Cyril Hnatovsky, Arnaud Grisard, Eric Lallier, Barry Luther-Davies, Wieslaw Krolikowski, Yan Sheng

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    Abstract

    We investigate nonlinear diffraction in orientation-patterned semiconductors and identify Čerenkov second harmonic generation in a transverse geometry of interaction. Čerenkov second harmonic allows nondestructive 3D visualization of the internal structure of orientationpatterned semiconductor.

    Original languageEnglish
    Title of host publicationCLEO
    Subtitle of host publicationScience and Innovations, CLEO-SI 2015
    PublisherOptica Publishing Group
    Pages2267
    Number of pages1
    ISBN (Electronic)9781557529688
    DOIs
    Publication statusPublished - 4 May 2015
    EventCLEO: Science and Innovations, CLEO-SI 2015 - San Jose, United States
    Duration: 10 May 201515 May 2015

    Publication series

    NameCLEO: Science and Innovations, CLEO-SI 2015

    Conference

    ConferenceCLEO: Science and Innovations, CLEO-SI 2015
    Country/TerritoryUnited States
    CitySan Jose
    Period10/05/1515/05/15

    Fingerprint

    Dive into the research topics of 'Visualization of the internal structure of orientation-patterned III-V semiconductors'. Together they form a unique fingerprint.

    Cite this