Waveguide analysis of heat-drawn and chemically etched probe tips for scanning near-field optical microscopy

Peter N. Moar; John D. Love; François Ladouceur; Laurence W. Cahill

doi:10.1364/AO.45.006442

Waveguide analysis of heat-drawn and chemically etched probe tips for scanning near-field optical microscopy

Peter N. Moar^*
, John D. Love
, François Ladouceur
, Laurence W. Cahill

^*Corresponding author for this work

Department of Quantum Science & Technology

Research output: Contribution to journal › Article › peer-review

Abstract

We analyze two basic aspects of a scanning near-field optical microscope (SNOM) probe's operation: (i) spot-size evolution of the electric field along the probe with and without a metal layer, and (ii) a modal analysis of the SNOM probe, particularly in close proximity to the aperture. A slab waveguide model is utilized to minimize the analytical complexity, yet provides useful quantitative results-including losses associated with the metal coating-which can then be used as design rules.

Original language	English
Pages (from-to)	6442-6456
Number of pages	15
Journal	Applied Optics
Volume	45
Issue number	25
DOIs	https://doi.org/10.1364/AO.45.006442
Publication status	Published - 1 Sept 2006

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10.1364/AO.45.006442

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title = "Waveguide analysis of heat-drawn and chemically etched probe tips for scanning near-field optical microscopy",

abstract = "We analyze two basic aspects of a scanning near-field optical microscope (SNOM) probe's operation: (i) spot-size evolution of the electric field along the probe with and without a metal layer, and (ii) a modal analysis of the SNOM probe, particularly in close proximity to the aperture. A slab waveguide model is utilized to minimize the analytical complexity, yet provides useful quantitative results-including losses associated with the metal coating-which can then be used as design rules.",

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AU - Ladouceur, François

AU - Cahill, Laurence W.

PY - 2006/9/1

Y1 - 2006/9/1

N2 - We analyze two basic aspects of a scanning near-field optical microscope (SNOM) probe's operation: (i) spot-size evolution of the electric field along the probe with and without a metal layer, and (ii) a modal analysis of the SNOM probe, particularly in close proximity to the aperture. A slab waveguide model is utilized to minimize the analytical complexity, yet provides useful quantitative results-including losses associated with the metal coating-which can then be used as design rules.

AB - We analyze two basic aspects of a scanning near-field optical microscope (SNOM) probe's operation: (i) spot-size evolution of the electric field along the probe with and without a metal layer, and (ii) a modal analysis of the SNOM probe, particularly in close proximity to the aperture. A slab waveguide model is utilized to minimize the analytical complexity, yet provides useful quantitative results-including losses associated with the metal coating-which can then be used as design rules.

UR - https://www.scopus.com/pages/publications/33750094871

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DO - 10.1364/AO.45.006442

M3 - Article

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VL - 45

SP - 6442

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JO - Applied Optics

JF - Applied Optics

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ER -

Waveguide analysis of heat-drawn and chemically etched probe tips for scanning near-field optical microscopy

Abstract

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